Schematic Integrity Analysis can be performed on electronic designs after they have been released into the market to improve the quality of the electronic design, increase yield, and decrease product returns.
Valydate’s technology can rapidly assess problematic released products, which are exhibiting less than ideal behavior vs. critical business targets such as:
- High Production Yield
- Low In-Warranty Failure Rate (MTBF)
- Low No-Fault-Found Rate
- High Install/Commissioning Success Rate
The presence of latent design defects and marginalities in field-released products can produce degradation of operating performance, causing the design team to be distracted in order to isolate the hidden root cause of problems. It is common for such diagnoses to consume multiple weeks of investigation, much of which is avoidable via Valydate’s screening of the design’s integrity.
By modeling problematic products, Valydate can systemically identify latent defects and marginalities providing design teams with a comprehensive overview of where to look to diagnose any performance-limiting problems. All in a fraction of the time and effort normally required. Valydate’s clients will experience improved R&D effectiveness, lowered in-warranty costs, higher production yields and reduced inventory burden caused by No-Fault-Found inventories and reduced sparing demands.
A problematic design can be modeled and results reported within a 2-3 week interval.